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JAMES DO
Address: 14215 Lotus Lane # 519, Centreville, VA 20120
Phone: 765-418-3379
E-mail: james.t.do@gmail.com
Permanent Address: 125 Grahams Road, Burnside, Christchurch, New Zealand
Objective
To gain full-time employment and develop keen interest in RF technology research and design.
Work Experience
07/06 – Present
Micron Technology Virginia (MTV) Manassas, VA
MTV Associate Engineer (H1-B work visa)
Carried out electrical failure analysis and physical failure analysis on 1GHz DDRII DRAM chips. Created Defect References and Monitored wafer yields for DRAM Fab.
Electrical Failure Analysis
-Used the EFA probe bench to pinpoint and narrow down failure locations and determine failure types. I.e. sensitivity of capacitor cells to shorter discharge time.
Physical Failure Analysis
-Used the etch tools and chem. lab to deprocess die and used the Scanning Electron Microscopes (SEM) and Focused Ion Beam (FIB) to take images of defects.
Data Analysis
-Used data tracking programs to find correlations and trends to narrow down causes of defects in die to a particular tool in the Fab.
Education
2002-2006 Purdue University West Lafayette, IN
Bachelors of Science in Electrical Engineering
GPA: 3.62, Major GPA: 3.68
Graduation Date: May 2006
Relevant Courses
RF and Microwave Wireless Components. (Graduate Level)
Distributed Parameter Systems.
Digital Signal Processing
Integrated Circuit Engineering.
Digital IC Analysis and Design. Advanced C Programming.
Semiconductor Devices.
Relevant Projects
- Design and fabrication of 802.11 patch antenna and monopole antenna using Ansoft HFSS.
-Bandpass filter Design and fabrication with lumped elements and micro strip using Agilent ADS and Ansoft HFSS for design and simulation.
-Horn antenna reflection experimentation and analysis with spectrum and network analyzers.
-Design and Fabrication of RF remote and material analyzer.
Computer Skills
Hardware: Network Analyzers, Spectrum Analyzers, Oscilloscopes, Curve Tracers, Smith Charts, Scanning Electron Microscope, Focused Ion Beam, Micron Probe Bench
Software: Agilent ADS, Ansoft HFSS, Ansoft Designer, PSPICE, ispLEVER, SecureCRT, Matlab.
Languages: C, ABEL, HTML
Study Abroad
06/05-08/05 Institut National Polytechnique Grenoble Grenoble, France Digital Image Processing, Signal Processing, Electromagnetism and Optics, French Culture, French.
Interests and Languages
Advanced level French and Mandarin
Tai Kwon Do black belt, grade 8 piano, Purdue intramural soccer champions 06 and guitar.
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