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Non-Destructive Transistor Tester
March 1971 Popular Electronics

March 1971 Popular Electronics

March 1971 Popular Electronics Cover - RF CafeTable of Contents

Wax nostalgic about and learn from the history of early electronics. See articles from Popular Electronics, published October 1954 - April 1985. All copyrights are hereby acknowledged.

In the days before just about every multimeter had a built-in diode and transistor tester, there was not much - if anything - available for the hobbyist. Some of the vacuum tube test sets, like my 1961 vintage B&K Dyna-Quik Model 650, surprisingly included diode and transistor test sockets. This article for a "non-destructive" type - as opposed to the popular "destructive" type - homebuilt transistor tester appeared in a 1971 issue of Popular Electronics magazine. It can identify PNP vs. NPN, measure DC gain, and measure leakage current. The tester will verify diode integrity as well. There's also a bonus "Parts Talk" comic on the page at no extra cost.

Check or Match Transistors and Diodes

Non-Destructive Transistor Tester, March 1971 Popular Electronics - RF CafeBy John L. Keith

Buying surplus or bargain-package transistors is a little like buying a pig in a poke. Especially if you get one of those so-called "computer boards" to which several transistors, usually unmarked, are connected. You may get some real high-quality, expensive units - some others may be completely useless. For the most part, the transistors that are in operating condition can be put to good use by the experimenter, provided he can sort them out as to type and identify their parameters, This can be done of course with a good transistor checker but not everyone has one of those so the simple transistor tester described here comes in very handy and saves time and money.

The transistor tester can be used to check either NPN or PNP transistors and will measure leakage down to 10 μA and collector current to 10 mA. You can measure ICO, IC (with 20 or 100 μA of base current), ICEO, ICES, and IEO (see sidebar for definitions). Diodes can also be checked by connecting them between the collector and emitter pins of the test socket. The tester is also useful for checking two transistors that must be matched for a specific application.

The tester has been designed so that it will check almost any type of transistor and cannot harm a unit regardless of the switch positions or the way the transistor is connected to the test socket.

Schematic Non-Destructive Transistor Tester - RF Cafe

Fig. 1 - All major transistor parameters can be checked using this tester since the novel circuit enables measurements from a low of 10 microamperes to high of 10 milliamperes.

Parts List Non-Destructive Transistor Tester - RF Cafe

Parts List

Selector Switch Wiring Non-Destructive Transistor Tester - RF Cafe

All the components except the battery are mounted on the front panel. The small parts such as resistors. capacitors and diodes are soldered directly to the two switches.

Meter Wiring Non-Destructive Transistor Tester - RF Cafe

Two resistors in parallel are used to make up the meter shunt resistor (R5) in order to obtain the required resistance value. Here again the components are mounted directly on the meter terminals.

Construction. As shown in the photographs, the prototype was built in a conventional plastic utility box with all components except the batteries mounted on the cover and with point-to-point wiring. The circuit is shown in Fig. 1.

The internal resistance of the meter movement is an integral part of the circuit. The combined resistance of the meter, R5, and R4 must be 12,000 ohms. The value of R4 must be chosen to obtain this value as closely as possible. With the meter specified in the Parts List, R4 should be about 11,000 ohms, This insures full compression and, with the circuit of D1 and R6, provides a full-scale reading of 10mA.

Operation. Insert the transistor to be tested in the test socket, place S1 on either IC1 or IC2, and depress pushbutton switch S3. The meter should deflect upscale when S2 is in the proper position. The position of the switch for upscale deflection determines whether the transistor is NPN or PNP.

To check the DC gain (HFE) of the transistor, place S1 on either IC1 or IC2, depress S3, and note the meter indication. Then determine the gain from the conversion table. Note that position IC1 is for a base current of 20 μA while position IC2 supplies a base current of 100 μA. The gain is different for the different base currents. The other four positions of S1 are to test for leakage currents. Obviously, the less leakage in any case, the better. In these tests, the meter indicates directly in microamperes.

To check a diode, connect it between the emitter and collector pins of the test socket and place S1 in either the IC1 or IC2 position. Depress S3 and note the meter readings when S2 is in the NPN and PNP positions. Ideally, in one position, the meter should indicate full scale and it should give no indication in the other position-indicating that the diode conducts in one direction and not the other. The lower the ratio between the two readings, the poorer the diode.

Parameter Definitions

ICEO - Collector current with base open. The polarity of the applied voltage is such that the collector-base junction is biased in a reverse direction.

ICES - Collector leakage current with base shorted to emitter. Equivalent to the leakage current of collector diode if emitter junction were not present. The polarity of the applied voltage is such that the collector-base junction is biased in a reverse direction.

IEO - Sometimes called IEBO. Emitter-base current with collector open. The polarity of the applied voltage is such that the emitter-base junction is biased in the reverse direction.

ICO - Sometimes called ICBO. Collector-base current with emitter open. The polarity of the applied voltage is such that the collector-base junction is biased in the reverse direction.

IC - Collector current - depends on the amount of base current supplied. A measure of DC gain (HFE).


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Posted March 27, 2019

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