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Arrhenius Lifetime Acceleration of an Integrated Circuit
The Arrhenius model predicts failure acceleration due to temperature increase. The Arrhenius activation energy, ΔH, is all that is needed to calculate temperature-related acceleration.
Arrhenius Model for Integrated Circuits
F =
x1 x2
= ea {Lifetime Acceleration Factor}
Where:
x1 = Failure rate at junction temperature T1 x2 = Failure rate at junction temperature T2 T = Junction temperature in degrees K ΔH = Thermal activation energy in eV k = Boltzmann's constant
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