•−•  ••−•    −•−•  •−  ••−•  • RF Cafe Morse Code >Hear It<
Job Board
About RF Cafe©
RF Cafe E-Mail

Arrhenius Lifetime Acceleration of an Integrated Circuit

The Arrhenius equation predicts failure acceleration rate due to temperature increase. Although originally developed to describe chemical reactions due to temperature, it applies equally well to electronic assembly failure rates. The Arrhenius activation energy, ΔH, is all that is needed to calculate temperature-related acceleration.

Swedish chemist Svante Arrhenius provided a physical justification and interpretation for his observation back in 1899. His equation can be used to model the temperature-variance of diffusion coefficients, population of crystal vacancies, creep rates, and many other thermally-induced processes/reactions. A useful generalization borne out by the Arrhenius equation is that for many common chemical reactions at room temperature, the reaction rate doubles for every 10 °C increase in temperature.

A Disruptive Web Presence™ Custom Search Over 10,000 pages indexed! (none duped or pirated)	Read About RF Cafe Webmaster: Kirt Blattenberger     KB3UON	RF Cafe Software RF Cascade Workbook RF system analysis including frequency conversion & filters RF & EE Symbols Word RF Stencils for Visio
	Product & Service Directory Personally Selected Manufacturers
	RF Cafe T-Shirts & Mugs
	RF Cafe Software Calculator Workbook RF Workbench Smith Chart™ for Visio Smith Chart™ for Excel