All RF Cafe quizzes would make perfect fodder for employment interviews for technicians or engineers - particularly those who are fresh out
of school or are relatively new to the work world. Come to think of it, they would make equally excellent study material for the same persons
who are going to be interviewed for a job.
Click here for the complete list of RF Cafe
Some of these books used in quizzes are available as prizes in the monthly
RF Cafe Giveaway.
Note: Many answers contain passages quoted in whole or in part from the text.
quiz is based on the information presented in Component Reliability for Electronic Systems
, by by
Bajenescu and Bazu , published by Artech House. Note: Some of these books
are available as prizes in the monthly RF
What is the mathematical technique for determining how often different values of a
given characteristic of a device are expected to occur?
a) Integration of variables
c) Likelihood of occurrence analysis
What is the name given to the lifetime failure curve
shown to the right?
a) Bathtub curve
b) Curved-flat-curved graph
c) Sideways "C" chart
d) Hockey stick curve
What is the largest contributor to contamination during semiconductor manufacture?
Which type of semiconductor type has the lowest tolerance to radiation fields?
a) Isoplanar ECL
What is/are the most
common cause of product failure?
a) Design deficiencies
b) Process errors
c) Process variations
d) All the above6.
Which of the three lifetime
failure curve (see Q2) regions is where an electromigration failure is most likely to occur?
b) Useful operating period
c) Infant mortality
d) Does not apply
What process is used to apply an electrical stress to components prior to shipping?
Which type of
test checks for susceptibility to moisture on a IC die's surface?
a) Submersion test
b) Wetness tolerance
c) Damp heat test
d) Water torture9.
What is a
major advantage of the thick film hybrid process over a thin film process?
a) More dimensionally stable
b) Higher circuit density
c) Higher component tolerances
d) Easy to cross conductor lines
What is a type of failure present in MEMS components not commonly found in standard ICs?
b) Surface abrasion
c) Lead impedance shifting
d) Substrate expansion
Need some help? Click here for the
answers and explanations.