EDI CON USA Announces Four Short Courses on RF, Microwave, and High-Speed Digital Design |
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June 20, 2016 (Norwood, Mass.) – EDI CON USA 2016, a conference that brings together engineers working on high-frequency analog and high-speed digital designs, taking place September 20-22 in Boston, Mass. at the Hynes Convention Center, is pleased to announce a full line up of short courses available to conference attendees. The short courses will take place in the afternoon on the third day of the conference, Thursday September 22, 2016. They are included in the conference pass type for attendees and no additional registration is required.
Radiated Emissions - Product Evaluation and Pre-Compliance Testing presented by EMC consultant Ken Wyatt, will explain the most common reasons for product failure, describe a straightforward process for troubleshooting radiated emissions, and demonstrate how to perform simple pre-compliance testing on a budget. Radiated emissions is usually the number one failure when it comes to EMC compliance testing. This short course will help you "know before you go"! Wyatt's specialty is EMI troubleshooting and pre-compliance testing and is a co-author with Patrick André, of the book, EMI Troubleshooting Cookbook for Product Designers. He has been widely published and has taught EMC design and test to thousands of engineers worldwide, and he recently joined the staff as technical editor at Interference Technology. Fundamentals of Power Integrity will be presented by Steve Sandler and Heidi Barnes, who are bringing their Power Integrity Bootcamp to engineers worldwide with a stop at EDI CON USA. Power integrity is important to the entire system performance and consists of much more than power distribution noise. This short course provides an understanding of power integrity, why it is important, how to design for it, and it teaches techniques for high-fidelity simulation, analysis and measurement. The goal is to enable you to better isolate, troubleshoot, and optimize power related issues. Sandler is the founder and CEO of Picotest.com, a company that designs and distributes test accessories related to power system measurement. He is the author of several power related books including his most recent book Power Integrity Measuring, Optimizing and Troubleshooting Power Systems. Heidi Barnes is a Senior Application Engineer for High Speed Digital applications in the EEsof EDA Group of Keysight Technologies. Her past experience includes over 6 years in signal integrity for ATE test fixtures for Verigy, an Advantest Group, and 8 years in RF/Microwave microcircuit packaging for Agilent Technologies. Basics, Advances, & Breakthroughs in Phased-Arrays, Radar, and MIMO will be presented by EDI CON USA's honorary chair, Dr. Eli Brookner, who is renowned for his contributions to radar technology. Dr. Brookner recently presented a similar short course at EDI CON China, and is now bringing his expertise to the US audience. This short course will cover array basics as well as recent technology advances, making careful comparisons between conventional radar arrays and MIMO ones. Dr. Brookner retired from Raytheon as Principal Engineering Fellow in 2014 after a long and distinguished career spanning more than 50 years. He has contributed to radars for air traffic control, defense, space and navigation. He has been recognized with numerous awards and honors, including Fellow of the IEEE, AIAA, and MSS; the 2006 IEEE Dennis J. Picard Medal for Radar Technology and Application; and the 2003 IEEE Warren White Award. He has written four books on radar systems, phased arrays and tracking. Attending the short courses will require a 1-day or 3-day conference pass. Conference registration is open now http://www.ediconusa.com/registration.asp. Information about sponsorship is available at http://ediconusa.com/exhibitors.asp. In addition to the short courses, the EDI CON USA technical conference includes a plenary session and three days of technical sessions, workshops, and panels. In the exhibition hall, the program also includes educational sessions in the Frequency Matters Theater, poster sessions, the Signal Integrity Zone, hands-on training opportunities, as well as demonstrations and product exhibits in more than 120 booths. About EDI CON USA EDI CON USA uniquely brings together RF, microwave, EMC/EMI, and high-speed digital design engineers and system integrators for networking, training, and learning opportunities. Attendees come to EDI CON USA to find solutions, products, and design ideas that they can put into immediate practice for today's communication, defense, consumer electronics, aerospace, and medical industries. Drawing attendees from both the analog and digital spheres, EDI CON enables designers to see techniques and technologies used in other applications that could be applied or adapted to solve their latest design challenges. The exhibition hall features product displays, demonstrations, design contests, interactive sessions, speed trainings, networking opportunities, and educational talks that will address all aspects of design, simulation, test, and verification. About the Organizers EDI CON USA is organized by Microwave Journal and the event planning division of its parent company, Horizon House. Microwave Journal and Horizon House also team with Microwave Journal China and ACT International (Hong Kong) to organize and produce EDI CON China. An experienced and well-established organizer of targeted events, Horizon House additionally organizes European Microwave Week (EuMW) on behalf of the European Microwave Association (EuMA) and several major microwave related conferences/exhibitions such as the M2M and Mobile Backhaul Zones at CTIA Super Mobility. The EDI CON program is developed in collaboration with leading international technology companies and experts in high-frequency and high-speed electronic design with experience ranging from modeling and design to component characterization, system integration, and verification. Event Contact: Janine Love, Event Director Sales Contact: Carl Sheffres, Publisher Editorial Contacts: North America: International:
Posted June 21, 2016 |
Intuitive Microwave Filter Design With EM Simulation presented by Dan Swanson will outline
a common design flow for high-Q cavity filter types and planar thin film filters, and then the course will highlight ways
to make the design process as efficient as possible. Discussion will include EM simulation. A renowned filter expert, Swanson
is a Fellow of the IEEE, has published numerous technical papers, given workshops, and holds two patents. He is also the
principle author of the book Microwave Circuit Modeling Using Electromagnetic Field Simulation, published by Artech House.