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About RF Cafe
1996 - 2022
BSEE - KB3UON
RF Cafe began life in 1996 as "RF Tools" in an AOL screen name web space totaling 2 MB. Its primary purpose was to provide me with ready access to commonly needed formulas and reference material while performing my work as an RF system and circuit design engineer. The Internet was still largely an unknown entity at the time and not much was available in the form of WYSIWYG ...
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EL SEGUNDO, Calif. – July 22, 2015 – NI (formerly AWR Corporation) announces that NI AWR Design Environment™ will be on display within the Academic Forum, 5G/RF Pavilion and two technical sessions - High-Efficiency PAs for High PAR Signals Using an NI-Based Platform and Improving the Semiconductor Design-to-Test Flow Panel - during NIWeek 2015, August 3-5 in Austin, Texas. Details include:
Academic Forum – Aug. 3, Austin Convention Center (ACC) Ballroom G
Poster presentation from IMS2015 Student Design Competition Winners
5G/RF Pavilion – Aug. 4-5, ACC Halls 2-3
High-Efficiency PAs for High PAR Signals – Aug. 4, 3:30p.m., ACC Ballroom F
Speaker: Dr. Zoya Popovic, UC Boulder
Communication and radar signals have increased peak-to-average power ratios and bandwidths for efficient spectrum use, which implies reduced transmitter average efficiency. Doherty, supply-modulated (ET), and outphasing transmitters offer possible efficiency improvements. At this session, learn about various microwave monolithic integrated circuit (MMIC) power amplifier (PA) designs with 3 W to 10 W output power and peak power-added efficiency greater than 60 percent at X-band using the Qorvo 150 nm gallium nitride (GaN) process. Discover how outphasing and Doherty PAs exhibit load modulation and examine the internal measurements of load modulation in several X-band PAs.
Improving the Semiconductor Design-to-Test Flow Panel – Aug. 5, 10:30a.m., Hilton #408
Panel: Qualcomm, Texas Instruments, Cadence, OptimalPlus, Extreme-EDA and NI
While the semiconductor development process is fairly mature, significant gaps still exist in the typical design flow. Inefficiencies exist between the early design engineering phase, lab characterization, and volume production testing. Siloed flows, duplication of effort, and lack of IP re-use is causing schedule delays and higher costs. In this session, experts in chip design, verification, and test will present their views on the challenges and potential solutions for improving the overall semiconductor development process.
For complete details for these sessions, visit: awrcorp.com/news/events/event/niweek-2015
About NI AWR Software
The NI AWR Design Environment software portfolio includes RF/microwave electronic design automation (EDA) tools such as Visual System Simulator for system design, Microwave Office/Analog Office for microwave/RF circuit design, and AXIEM and Analyst for electromagnetic analysis. NI AWR software tools help design engineers to dramatically reduce development time and cost for components, circuits, systems and subsystems employed in wireless, high-speed wired, broadband, aerospace and defense, and electro-optical applications. Readers can learn more at ni.com/awr.
About National Instruments
Since 1976, NI has made it possible for engineers and scientists to solve the world’s greatest engineering challenges with powerful, flexible technology solutions that accelerate productivity and drive rapid innovation. Customers from a wide variety of industries–from healthcare to automotive and from consumer electronics to particle physics–use NI’s integrated hardware and software platform to improve the world we live in.
Vice President of Marketing
AWR Group, NI
Posted July 23, 2015