Agilent Technologies Collaborates with Thales to Apply X-Parameters
Technology to RF System Design
June 20, 2012 Press Release
SANTA CLARA, Calif., June 20, 2012 – Agilent Technologies Inc. (NYSE: A) today announced that its ongoing
collaboration with Thales, a global technology leader for the defense and security and the aerospace and transport
markets, has expanded the reach of
X-parameters technology to wideband super-heterodyne receiver applications
X-parameters represent an
entirely new category of nonlinear network parameters for high-frequency design. They allow engineers to
accurately characterize linear and nonlinear components, circuits or systems, and provide fast and reliable
behavioral modeling—capabilities vital to designing high-performance RF modules and system-in-package components.
X-parameters can be generated either from simulation with Agilent’s Advanced Design System EDA software or from
Agilent’s test and measurement instruments, for faster development of communications products.
collaboration with Thales on nonlinear behavioral models began in 2005. The primary goal of the effort was for
Thales to validate the use of the technology for RF system design. As a result of this collaboration, Thales
successfully developed a high-accuracy spurious analysis methodology based on X-parameter models.
Thales technique supports arbitrary topology and has been tested for RF systems with single-frequency conversion.
Subsequent spurious analysis of such systems has yielded excellent results. Additionally, the accuracy and dynamic
range of the spectral content far surpassed results obtained using other currently available industry methods and
“We are proud to have worked with Agilent over the years as the X-parameters concept has grown in
acceptance within the industry,” said Jean Paul Martinaud, hardware modeling manager with Thales Defence Mission
Systems Division. “We have been able to extend the application of X-parameters to single-frequency conversion
modeling, something that traditionally would have been done using conventional nonlinear behavioral models. We
look forward to continuing this collaborative effort and working toward further extending the use of X-parameters
to more complex systems.”
“As the inventors of X-parameters, Agilent continues to innovate around the
technology in response to the challenges of nonlinear modeling and measurement,” said Thierry Locquette, a sales
manager for Agilent EEsof EDA. “Our work with Thales has resulted in yet another proof-of-concept of this
technology and further cements its position as the de facto industry standard.”
Agilent will demonstrate
X-parameters, along with solutions that cover everything from circuit-level modeling through system verification
for general RF, microwave, 4G communications, and aerospace/defense applications, at IMS 2012/IEEE MTT-S (Booth
1015), June 19-21, in Montréal, Canada. A range of premier partner solutions will also be available on Agilent
Avenue and throughout the event area.
For more information on X-parameters, go to
About Agilent EEsof EDA Software
Advanced Design System is the world’s leading
electronic design automation software for RF, microwave, and high-speed digital applications. In a powerful and
easy-to-use interface, ADS
pioneers the most innovative and commercially successful technologies, such as X-parameters* and 3-D
electromagnetic simulators, used by leading companies in wireless communications and networking as well as the
aerospace and defense industries. For more information about Agilent ADS, visit
About Agilent Technologies
Agilent Technologies Inc. (NYSE: A) is the world’s premier
measurement company and a technology leader in chemical analysis, life sciences, electronics and communications.
The company’s 18,700 employees serve customers in more than 100 countries. Agilent had net revenues of $6.6
billion in fiscal 2011. Information about Agilent is available at www.agilent.com.
*X-parameters is a trademark of Agilent Technologies. The X-parameter format and underlying equations are open and
documented. For more information, visit
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