Media Alert: AWR’s Dr. John Dunn Authors Guest Column for RF GlobalNet on “Electromagnetic Simulation:
Tips, Tricks, & Tradeoffs”
El Segundo, CA – January 24, 2011
What: AWR® Corporation’s Dr. John Dunn will contribute regularly to a guest column series for
VertMarkets, Inc.’s RF GlobalNet on “Electromagnetic (EM) Simulation: Tips, Tricks & Tradeoffs.” The first article
will launch on January 25th and is titled, “The Trouble with EM Is That It Always Gives an Answer.” This aim of
the series is to discuss the issues that today’s design engineers face while using EM simulation tools and to
provide useful and practical advice, tips and tactics that improve design accuracy and turn-around times whether
the EM tool user is a novice, casual and/or power user.
Dr. Dunn is a recognized expert in electromagnetic modeling and
simulation for high-speed circuit applications. Before joining AWR, he was head of the Interconnect Modeling Group
at Tektronix and earlier was a professor of electrical engineering at the University of Colorado, where he led a
research group in electromagnetic simulation and modeling. Dr. Dunn received his BA degree in physics from
Carleton College and his MS and PhD degrees in applied physics from Harvard University.