Notice: Keithley Instruments No Longer Sells RF Products
FOR IMMEDIATE RELEASE
Contact: Ellen Modock
Keithley Instruments, Inc.
Reader Inquiries: 1-800-688-9951
Keithley Instruments Intros New Upconverter Supports Transceiver Test, Simplifies Test System Design
Cleveland, Ohio - June 9, 2009 -
Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced
electrical test instruments and systems, introduces the
Model 2891-IQ Upconverter
, which provides comprehensive support for transceiver testing by processing analog I
and Q baseband signals for testing a transceiver's transmitter, as well as processing analog I and Q output
signals for testing a transceiver's receiver. To learn more about Keithley's
converts single-ended baseband analog I and Q signals from a signal generator into differential
output signals to provide input signals for testing transceivers with differential baseband I,Q inputs. On the
receiver side, it converts the receiver's down-converted differential I and Q signals into a modulated,
up-converted signal for receiver performance testing by an RF signal analyzer. It speeds and simplifies designing
transceiver test systems because it interfaces easily with both RF transceivers and with Keithley's Series 2900 RF
Vector Signal Generators and Series 2800 RF Vector Signal Analyzers.
The combination of the
with the Model 2920 Vector Signal Generator and the Model 2820A Vector Signal Analyzer makes it
easy to create a small, simple, and cost-effective RF transceiver test system. The
contains gain adjustments so that it can interface with a wide variety of wireless chipsets and
devices. Furthermore, the
can interface with RF transceivers with either single-ended or differential inputs. Its EVM
floor of 41dB, even for wideband 40MHz-bandwidth 802.11n signals, makes it possible to use the Model 2891-IQ when
making high quality modulation measurements.
This instrument's compact size makes it ideal for locating it
close to the wireless device under test (DUT), which helps minimize loading, even on high impedance devices, and
maximizes signal bandwidth. Similarly, the selectable 50Ω/100kΩ input impedance of the
's inputs allows it to connect to high impedance devices with minimal signal loss. The
instrument's high performance IQ modulator provides excellent signal fidelity, allowing the DUT's receiver signals
to be measured without noise floor or spurious signal interference from the instrument itself. For example, the
's sideband suppression is less than 51dBc.
The instrument is controlled through a USB
connection and programmed with a simplified SCPI command set. An easy-to-use software control panel provides
intuitive access to these commands. Signal differential offsets may be set and adjusted and modulator gain set. A
non-volatile EEPROM allows storing and recalling ten user instrument states.
will be introduced to the wireless test market at the International Microwave Symposium (IMS),
the world's premier microwave conference. In 2009, the IEEE Microwave Theory and Techniques Society (MTT-S)
International Microwave Symposium 2009 (IMS 2009) will be held in Boston, Massachusetts, as the centerpiece of
Microwave Week 2009, scheduled from June 7 through June 12.
Price and Availability
The price of the
Upconverter is $5,000 USD. Orders are being taken now for delivery in 10 weeks.
For More Information
For more information on the new Model 2891-IQ Upconverter or any of
Keithley's other RF/wireless test solutions, visit
or contact the company at:
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has
become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our
customers are scientists and engineers in the worldwide electronics industry involved with advanced materials
research, semiconductor device development and fabrication, and the production of end products such as portable
wireless devices. The value we provide them is a combination of products for their critical measurement needs and
a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies