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Copyright: 1996 - 2024
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RF Cafe began life in 1996 as "RF Tools" in an AOL screen name web space totaling 2 MB. Its primary purpose was to provide me with ready access to commonly needed formulas and reference material while performing my work as an RF system and circuit design engineer. The World Wide Web (Internet) was largely an unknown entity at the time and bandwidth was a scarce commodity. Dial-up modems blazed along at 14.4 kbps while typing up your telephone line, and a nice lady's voice announced "You've Got Mail" when a new message arrived...

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Keithley Instruments - Press Release 7-12-2007

KEITHLEY INSTRUMENTS RECOGNIZED FOR EXCELLENCE
BY TEXAS INSTRUMENTS

Cleveland, Ohio – June 12, 2007 - Keithley Instruments, Inc. (NYSE:KEI), a leader in solutions for emerging measurement needs, announced today that it has received the Texas Instruments (TI) 2006 Supplier Excellence Award. The annual award honors firms whose dedication and commitment in supplying products and services meet TI's high standards for excellence. Recipients are chosen for their exemplary performance in the areas of cost, environmental responsibility, technology, responsiveness, assurance of supply, and quality. TI's management team from the WPL-Assembly and Test Capital Equipment business group presented the award to Keithley personnel.

Keithley supplies a wide range of electrical test and measurement hardware and software to TI, including the Model 4200-SCS Semiconductor Characterization System, the Series S600 Parametric Test Systems, and high performance sourcing/measuring/switching DC instrumentation.

The Model 4200-SCS incorporates tightly integrated DC and pulse measurement capabilities with application packages for turnkey semiconductor test solutions. Keithley recently announced a variety of enhancements to this system, including three new application packages, an enhanced pulse generator card, and a new scope card, that offer powerful new solutions for such areas such as Flash memory testing, high-power radio frequency (RF) device testing, and pulse testing for advanced semiconductor materials.

Keithley Series S600 parametric testers are designed to help fabs and wafer foundries reduce their cost of test. Key advantages of Series S600 testers include on-wafer DC to RF testing on a single platform, a wide range of applications, and SECS/GEM automation for 300 and 200 mm.

“This award is particularly meaningful given the strict standards and rigorous quality metrics required by TI,” said Keithley vice president, business management Mark Hoersten. “We are grateful to have customers recognize our own commitment to providing the highest levels of measurement integrity, outstanding customer service, and dedication to reducing Cost of Test.”

Hoersten added that the TI Supplier Excellence Award is one of several honors Keithley has won recently from customers and industry analyst groups that recognize the firm's gains in measurement performance and ability to deliver consistent customer service on a global scale.

For More Information For information on any of Keithley's test and measurement systems, visit http://www.keithley.com or contact the company at:

Telephone: 800-688-9951  440-248-0400

FAX: 440-248-6168

E-mail: publisher@keithley.com

Internet: www.keithley.com

Address:

Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891

About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Products and company names listed are trademarks or trade names of their respective companies.

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